VIP member
LW400T Large Platform Limited Remote Chip Inspection Microscope
LW400T Large Platform Limited Remote Chip Inspection Microscope
Product details
LW400T Large Platform Limited Remote Chip Inspection Metallographic Microscope
LW400T is widely used for observing transparent, semi transparent, or opaque substances. This instrument is equipped with a large moving range stage, a falling beam illumination device, a flat field metallographic objective lens, a large field eyepiece, clear images, good contrast, and a polarizing device. It is specially designed and manufactured for detecting wafers.
Standard configuration
eyepiece |
Wide field of view WF10X (Φ 18mm) |
objective |
Long distance flat field achromatic objective lens (without cover glass) PL 5X/0.12 |
Long distance flat field achromatic objective lens (without cover glass) PL L10X/0.25 | |
Long distance flat field achromatic objective lens (without cover glass) PL L20X/0.40 | |
Long distance flat field achromatic objective lens (without cover glass) PL L40X/0.60 | |
Long distance flat field achromatic objective lens (without cover glass) PL L80X/0.80 | |
eyepiece tube |
Triple eyepiece, tilted at 30 degrees, (with built-in polarizer, switchable) |
Falling light illumination system |
6V 20W halogen lamp, adjustable brightness |
Illuminator with field of view light barrier, aperture light barrier, polarizing film, (yellow, blue, green) color filter, and frosted glass | |
Focuser |
Stage lifting and lowering, coarse and fine coaxial focusing, fine grid value of 0.7 μ m, adjustable coarse and fine tension, with locking and limiting devices |
converter |
Five hole (outward facing ball and inward positioning) |
stage |
Three layer mechanical mobile size: 280mmX270mm, movement range: 204mmX204mm |
Online inquiry
-
Contacts
-
Company
-
Telephone
-
Email
-
WeChat
-
Verification Code
-
Message Content
-